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Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing
Author: Angela Krstic, Kwang-Ting (Tim) Cheng
With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices. After a long period of prevailing belief ...  more »
ISBN-13: 9780792382959
ISBN-10: 0792382951
Publication Date: 10/31/1998
Pages: 208
Edition: 1st
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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