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Electron Energy-Loss Spectroscopy in the Electron Microscope (The Language of Science)
Electron EnergyLoss Spectroscopy in the Electron Microscope - The Language of Science
Author: R.F. Egerton
The Second Edition explores several new applications of EELS developed during the last ten years. Chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ...  more »
ISBN-13: 9780306452239
ISBN-10: 0306452235
Publication Date: 5/31/1996
Pages: 500
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Publisher: Plenum US
Book Type: Hardcover
Members Wishing: 0
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