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Introduction to IDDQ Testing (Frontiers in Electronic Testing)
Introduction to IDDQ Testing - Frontiers in Electronic Testing
Author: S. Chakravarty, Paul J. Thadikaran
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then t...  more »
ISBN-13: 9780792399452
ISBN-10: 0792399455
Publication Date: 6/30/1997
Pages: 344
Edition: 1st
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Publisher: Springer
Book Type: Hardcover
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