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Scanning Electron Microscopy and X-ray Microanalysis
Scanning Electron Microscopy and Xray Microanalysis
Author: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics di...  more »
ISBN-13: 9780306472923
ISBN-10: 0306472929
Publication Date: 2/2003
Pages: 689
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Publisher: Plenum US
Book Type: Hardcover
Members Wishing: 0
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