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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Scanning Force Microscopy With Applications to Electric Magnetic and Atomic Forces - Oxford Series in Optical and Imaging Sciences
Author: Dror Sarid
Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has al...  more »
ISBN-13: 9780195092042
ISBN-10: 019509204X
Publication Date: 4/11/1994
Pages: 284
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Publisher: Oxford University Press
Book Type: Hardcover
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