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Self-Checking and Fault-Tolerant Digital Design
SelfChecking and FaultTolerant Digital Design
Author: Parag K. Lala
With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critica...  more »
ISBN-13: 9780124343702
ISBN-10: 0124343708
Publication Date: 1/15/2001
Pages: 216
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Publisher: Morgan Kaufmann
Book Type: Hardcover
Members Wishing: 0
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